ICP 2060T
Sequential Inductively Coupled Plasma Emission Spectrometer
Summary
ICP2060TSequentiallnductively Coupled Plasma Emission Spectrometer is designed to measure major, minor and trace elements in various samples with outstanding performance.
It was widely chosen in different industries for its superior optical resolution, high level of automation, reliable free running RF system as well as excellent analytical precision and accuracy.
ICP 2060T was widely applied in various fields ranging from rare earth, geology, metallurgy, chemistry, environmental protection, clinical medicine, petroleum products,semiconductors, foods,biological samples, criminal science, to agricultural research, etc.
Features
*Over 70 elements can be measured
*Fast analysis, 5-8 elements per minute
*Excellent detection limits, at ppb level for most elements
*Wide linear dynamic range, reaching 6 orders of magnitude, from ppb to percentage
*Lower gas consumption; Each argon gas cylinder can be used for 8 hours
Application
*Rare earth metal
*Silicon materials, magnetic materials processing industry
*Metallurgical industry: analysis of impurity elements influencing the quality of metal materials Water quality control
*Geology, mineral
*Petrochemical: measurements of more than 30 elements in crude oil
*Pharmacy, hygiene, agriculture, environmental protection, commodities and food industry
Advanced structure, optimized details make instrument accurate, stable and reliable
*Advanced optical design with a fully illuminated holographic grating, with spectral interference correction and high light throughput for improved detection limits
*Wide wavelength range:
190nm to 500nm with 3600 line grating
190nm to 800nm with 2400 line grating
*Computer controlled plasma platform optimizes the viewing position to reduce interferences, improve SNR and minimize background emissions
*Software controlled flow of carrier gas, plasma gas and auxiliary gas provide real time monitor as well as highly stability of flux
*Various types of torches, nebulizer as well as spray chamber are optional
*Choice of auto sampler greatly improves efficiency
*Sample waste drained by peristaltic pump ensures stable sample flow rate; Fast pump mode improves productivity
*The brand new robust free-running, 27.12 MHz RF generator that delivers unsurpassed performance
*Rapid and accurate automatic coupling system ensures the ultimate power transfer efficiency and stability
Humanized software design makes operation easier and simpler
One-button plasma ignition
By simply click the button 'inflame' in software , the plasma can be ignited immediately.(as figure 1)
Powerful graph diagnosis function
The 'graph diagnosis' function provides information on instrument status and analysis progress. (as figure 2)
Multi-element analysis
After selecting elements and setting measuring parameters, instrument will measure automatically with results directly displayed. (as figure 3)
Enhanced database management
The database contains several thousands of spectral line, where users can choose freely based on application method. (as figure 4)
Strong and User-friendly Software
The professional software provide excellent features and multi access to functions as follow:
Data management, quantitative and qualitative analysis, test parameter setting, one button report generation, background and interference correction, fast calibration mode, instrument status indication, and online self diagnostic.
Instrument Structure Diagram
Specifications
Solid State Power | Electronic Measurement& Control Circuit |
Frequency:27.12MHz | Photomultiplier tube specification:R212/R928 |
Frequency stability:<0.05% | Negativehigh voltage:(-50~-1000)V |
Matching:Automatch | Circuit measuring range:(10-12~10-4)A |
Output power:800W ~1600W,continuously adjustable with power efficiency more than 65% | Signal acquisition:VF conversion |
Computer | |
Output power stability:≤0.05% | Lenovo PC |
Induction coil:ID 25mmx3,equipped with three concentric quartz torch tubes of ED 35mm(ID:internal diameter;ED:external diameter) | Monitor:17 Inches LCD Monitor |
Printer:Canon inkjet | |
Spray chamber:Scott double pass spray chamber | Main power supply:AC 220VCurrent:20A |
Monochromator | Technical Specifications | ||
Optical type:Czery turner | Suitable sample content range | Liquid sample:0.01ppm~several thousands ppm | |
Focal length:1000mm | Solid or powder sample:0.001%~70% | ||
Resolution | ≤0.015nm(3600 line grating) | Repeatability:short-term stability,RSD≤1.5% | |
≤0.030nm(2400 line grating) | Long-term stability:RSD<2% | ||
Grating specification | huge holographic grating with 3600L/mil or 2400 L/mil and 80 mmx100mm of ruling area | Test speed:55~8elements/min | |
Limits of dete stection(LOD,μg/L)for typical elements:1ppb~10ppb | |||
Wavelength range | 195~500 nm for 3600 line grating | Machine Size | |
195~800 nm for 2400 line grating | Desktop1.5mx0.8mx0.8m |
Working environment
ltem | Description |
Temperature for storage and transportation | 15℃-25℃ |
Humidity for storage and transportation | ≤70% |
Power stability | 220±10V50-60Hz |
Humidity | ≤70% |
Temperature | 15℃-30℃ |
Other accessories
Windpipe | Voltage stabilizer |
Gas pressure regulator | ICP 2060T power cable |
Water cooling system | Copper cable for ground |
Sampling system include nebulizer,spray chamber, plasma torch |
Detection limits for typical elements (here λ refers to wavelength)(μg/L):
Element λ(nm) LOD | La 408.672 <3.0 | Ce 413.765 <5.0
| Pr 414.311 <5.0 | Nd 401.225 <5.0 | Sm 360.946 <10.0 | Al 396.152 <5.0 | Zr 343.823 <5.0 | Ag 328.068 <3.0 | Sr 407.771 <1.0 | Au 242.795 <5.0 |
Element λ(nm) LOD | Eu 381.967 <1.0 | Gd 342.247 <10.0 | Tb 350.917 <3.0 | Dy 353.170 <3.0 | Ho 345.600 <3.0 | Pt 265.945 <5.0 | Pd 340.458 <5.0 | Lr 224.268 <10.0 | Rh 343.489 <10.0 | Ru 240.272 <5.0 |
Element λ(nm) LOD | Er 337.271 <3.0 | Tm 313.126 <3.0 | Yb 369.419 <31.0 | Lu 261.541 <3.0 | Y 371.030 <1.0 | Ba 455.403 <1.0 | Cr 267.716 ≤15.0 | Sb 206.833 <15.0 | Bi 223.061 ≤10 | Hg 253.652 ≤15.0 |
Element λ(nm) LOD | Sc 335.373 <1.0 | Ta 226.230 <5.0 | Nb 313.340 <5.0 | Mn 257.610 <3.0 | Mg 279.553 <1.0 | Pb 220.353 ≤15 | Ga 294.364 ≤10 | Se 203.985 ≤10 | Sn 242.949 ≤20 | Te 214.281 ≤10. |
Element λ(nm) LOD | B 249.773 <10.0 | Zn 13.856 <3.0 | Co 228.616 <3.0 | Si 251.611 <103.0 | Os 225.585 ≤1 | Ta 226.230 ≤5.0 | Th 283.730 ≤10 | Tl 276.787 ≤30 | Re 227.525 ≤5 | Ge 209.426 ≤15 |
Element λ(nm) LOD | Ni 232.033 <5.0 | Cd 226.502 <3.0 | Fe 239.562 <3.0 | Ca 393.366 <1.0 | Mo 281.615 <5.0 | W 207.911 ≤10 | Li 670.784 ≤3 | Na 588.995 ≤20 | K 766.490 ≤60 | Cu 324.754 <3.0 |
Element λ(nm) LOD | V 310.230 <5.0 | Be 313.041 <1.0 | Ti 334.941 <3.0 |